Daily Papers

Genuine leather, such as the hides of cows, crocodiles, lizards and goats usually contain natural and artificial defects, like holes, fly bites, tick marks, veining, cuts, wrinkles and others. A traditional solution to identify the defects is by manual defect inspection, which involves skilled experts. It is time consuming and may incur a high error rate and results in low productivity. This paper presents a series of automatic image processing processes to perform the classification of leather defects by adopting deep learning approaches. Particularly, the leather images are first partitioned into small patches,then it undergoes a pre-processing technique, namely the Canny edge detection to enhance defect visualization. Next, artificial neural network (ANN) and convolutional neural network (CNN) are employed to extract the rich image features. The best classification result achieved is 80.3 %, evaluated on a data set that consists of 2000 samples. In addition, the performance metrics such as confusion matrix and Receiver Operating Characteristic (ROC) are reported to demonstrate the efficiency of the method proposed.

In this study, we applied the PointRend (Point-based Rendering) method to semiconductor defect segmentation. PointRend is an iterative segmentation algorithm inspired by image rendering in computer graphics, a new image segmentation method that can generate high-resolution segmentation masks. It can also be flexibly integrated into common instance segmentation meta-architecture such as Mask-RCNN and semantic meta-architecture such as FCN. We implemented a model, termed as SEMI-PointRend, to generate precise segmentation masks by applying the PointRend neural network module. In this paper, we focus on comparing the defect segmentation predictions of SEMI-PointRend and Mask-RCNN for various defect types (line-collapse, single bridge, thin bridge, multi bridge non-horizontal). We show that SEMI-PointRend can outperforms Mask R-CNN by up to 18.8% in terms of segmentation mean average precision.

This survey paper offers a comprehensive review of methodologies utilizing machine learning (ML) classification techniques for identifying wafer defects in semiconductor manufacturing. Despite the growing body of research demonstrating the effectiveness of ML in wafer defect identification, there is a noticeable absence of comprehensive reviews on this subject. This survey attempts to fill this void by amalgamating available literature and providing an in-depth analysis of the advantages, limitations, and potential applications of various ML classification algorithms in the realm of wafer defect detection. An innovative taxonomy of methodologies that we present provides a detailed classification of algorithms into more refined categories and techniques. This taxonomy follows a three-tier structure, starting from broad methodology categories and ending with specific techniques. It aids researchers in comprehending the complex relationships between different algorithms and their techniques. We employ a rigorous empirical and experimental evaluation to rank these varying techniques. For the empirical evaluation, we assess techniques based on a set of five criteria. The experimental evaluation ranks the algorithms employing the same techniques, sub-categories, and categories. Also the paper illuminates the future prospects of ML classification techniques for wafer defect identification, underscoring potential advancements and opportunities for further research in this field

In recent years, Printed Circuit Boards (PCB) have become the backbone of a large number of consumer electronic devices leading to a surge in their production. This has made it imperative to employ automatic inspection systems to identify manufacturing defects in PCB before they are installed in the respective systems. An important task in this regard is the classification of defects as either true or pseudo defects, which decides if the PCB is to be re-manufactured or not. This work proposes a novel approach to detect most common defects in the PCBs. The problem has been approached by employing highly discriminative features based on multi-scale wavelet transform, which are further boosted by using a kernalized version of the support vector machines (SVM). A real world printed circuit board dataset has been used for quantitative analysis. Experimental results demonstrated the efficacy of the proposed method.

In the field of integrated circuit manufacturing, the detection and classification of nanoscale wafer defects are critical for subsequent root cause analysis and yield enhancement. The complex background patterns observed in scanning electron microscope (SEM) images and the diverse textures of the defects pose significant challenges. Traditional methods usually suffer from insufficient data, labels, and poor transferability. In this paper, we propose a novel few-shot learning approach, SEM-CLIP, for accurate defect classification and segmentation. SEM-CLIP customizes the Contrastive Language-Image Pretraining (CLIP) model to better focus on defect areas and minimize background distractions, thereby enhancing segmentation accuracy. We employ text prompts enriched with domain knowledge as prior information to assist in precise analysis. Additionally, our approach incorporates feature engineering with textual guidance to categorize defects more effectively. SEM-CLIP requires little annotated data, substantially reducing labor demands in the semiconductor industry. Extensive experimental validation demonstrates that our model achieves impressive classification and segmentation results under few-shot learning scenarios.

As AI code assistants become increasingly integrated into software development workflows, understanding how their code compares to human-written programs is critical for ensuring reliability, maintainability, and security. In this paper, we present a large-scale comparison of code authored by human developers and three state-of-the-art LLMs, i.e., ChatGPT, DeepSeek-Coder, and Qwen-Coder, on multiple dimensions of software quality: code defects, security vulnerabilities, and structural complexity. Our evaluation spans over 500k code samples in two widely used languages, Python and Java, classifying defects via Orthogonal Defect Classification and security vulnerabilities using the Common Weakness Enumeration. We find that AI-generated code is generally simpler and more repetitive, yet more prone to unused constructs and hardcoded debugging, while human-written code exhibits greater structural complexity and a higher concentration of maintainability issues. Notably, AI-generated code also contains more high-risk security vulnerabilities. These findings highlight the distinct defect profiles of AI- and human-authored code and underscore the need for specialized quality assurance practices in AI-assisted programming.

Power line maintenance and inspection are essential to avoid power supply interruptions, reducing its high social and financial impacts yearly. Automating power line visual inspections remains a relevant open problem for the industry due to the lack of public real-world datasets of power line components and their various defects to foster new research. This paper introduces InsPLAD, a Power Line Asset Inspection Dataset and Benchmark containing 10,607 high-resolution Unmanned Aerial Vehicles colour images. The dataset contains seventeen unique power line assets captured from real-world operating power lines. Additionally, five of those assets present six defects: four of which are corrosion, one is a broken component, and one is a bird's nest presence. All assets were labelled according to their condition, whether normal or the defect name found on an image level. We thoroughly evaluate state-of-the-art and popular methods for three image-level computer vision tasks covered by InsPLAD: object detection, through the AP metric; defect classification, through Balanced Accuracy; and anomaly detection, through the AUROC metric. InsPLAD offers various vision challenges from uncontrolled environments, such as multi-scale objects, multi-size class instances, multiple objects per image, intra-class variation, cluttered background, distinct point-of-views, perspective distortion, occlusion, and varied lighting conditions. To the best of our knowledge, InsPLAD is the first large real-world dataset and benchmark for power line asset inspection with multiple components and defects for various computer vision tasks, with a potential impact to improve state-of-the-art methods in the field. It will be publicly available in its integrity on a repository with a thorough description. It can be found at https://github.com/andreluizbvs/InsPLAD.

To coupe with the difficulties in the process of inspection and classification of defects in Printed Circuit Board (PCB), other researchers have proposed many methods. However, few of them published their dataset before, which hindered the introduction and comparison of new methods. In this paper, we published a synthesized PCB dataset containing 1386 images with 6 kinds of defects for the use of detection, classification and registration tasks. Besides, we proposed a reference based method to inspect and trained an end-to-end convolutional neural network to classify the defects. Unlike conventional approaches that require pixel-by-pixel processing, our method firstly locate the defects and then classify them by neural networks, which shows superior performance on our dataset.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Electroluminescence (EL) imaging is a useful modality for the inspection of photovoltaic (PV) modules. EL images provide high spatial resolution, which makes it possible to detect even finest defects on the surface of PV modules. However, the analysis of EL images is typically a manual process that is expensive, time-consuming, and requires expert knowledge of many different types of defects. In this work, we investigate two approaches for automatic detection of such defects in a single image of a PV cell. The approaches differ in their hardware requirements, which are dictated by their respective application scenarios. The more hardware-efficient approach is based on hand-crafted features that are classified in a Support Vector Machine (SVM). To obtain a strong performance, we investigate and compare various processing variants. The more hardware-demanding approach uses an end-to-end deep Convolutional Neural Network (CNN) that runs on a Graphics Processing Unit (GPU). Both approaches are trained on 1,968 cells extracted from high resolution EL intensity images of mono- and polycrystalline PV modules. The CNN is more accurate, and reaches an average accuracy of 88.42%. The SVM achieves a slightly lower average accuracy of 82.44%, but can run on arbitrary hardware. Both automated approaches make continuous, highly accurate monitoring of PV cells feasible.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Segmentation-based, two-stage neural network has shown excellent results in the surface defect detection, enabling the network to learn from a relatively small number of samples. In this work, we introduce end-to-end training of the two-stage network together with several extensions to the training process, which reduce the amount of training time and improve the results on the surface defect detection tasks. To enable end-to-end training we carefully balance the contributions of both the segmentation and the classification loss throughout the learning. We adjust the gradient flow from the classification into the segmentation network in order to prevent the unstable features from corrupting the learning. As an additional extension to the learning, we propose frequency-of-use sampling scheme of negative samples to address the issue of over- and under-sampling of images during the training, while we employ the distance transform algorithm on the region-based segmentation masks as weights for positive pixels, giving greater importance to areas with higher probability of presence of defect without requiring a detailed annotation. We demonstrate the performance of the end-to-end training scheme and the proposed extensions on three defect detection datasets - DAGM, KolektorSDD and Severstal Steel defect dataset - where we show state-of-the-art results. On the DAGM and the KolektorSDD we demonstrate 100\% detection rate, therefore completely solving the datasets. Additional ablation study performed on all three datasets quantitatively demonstrates the contribution to the overall result improvements for each of the proposed extensions.

The increasing global deployment of solar photovoltaic (PV) systems needs robust, scalable, and automated inspection technologies capable of detecting a wide range of panel flaws under a variety of operating situations. The lack of large-scale, multi-modal, publicly available annotated datasets is a major obstacle preventing advancement in this field. We introduce SolarFCD, an extensive dataset of solar panel defects created by methodically combining and reconciling three publicly accessible datasets covering two imaging modalities: RGB/Drone images and Thermal Infrared. The dataset consist of 4,435 images arranged under four unified defect classes such as: healthy images, Surface Obstruction, structural fault, and electrical fault. The dataset was divided into training, validation, and test splits at an 80:10:10 ratio through methodical label mapping, near-duplicate removal, and targeted augmentation of minority classes. Sixteen classification architectures from five design families were trained and assessed on the dataset to provide repeatable benchmark baselines. With an accuracy of 86.68%, precision of 88.65%, recall of 88.62%, and F1-score of 88.17%, ResNet101V2 performed the best overall. Per-class results showed balanced detection across all four defect categories within a narrow performance band of less than 1.2 percentage points. To promote open and repeatable research in automated PV inspection and solar energy operations and maintenance, the dataset, annotation files, and baseline code are made openly available.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

The use of modern Natural Language Processing (NLP) techniques has shown to be beneficial for software engineering tasks, such as vulnerability detection and type inference. However, training deep NLP models requires significant computational resources. This paper explores techniques that aim at achieving the best usage of resources and available information in these models. We propose a generic approach, EarlyBIRD, to build composite representations of code from the early layers of a pre-trained transformer model. We empirically investigate the viability of this approach on the CodeBERT model by comparing the performance of 12 strategies for creating composite representations with the standard practice of only using the last encoder layer. Our evaluation on four datasets shows that several early layer combinations yield better performance on defect detection, and some combinations improve multi-class classification. More specifically, we obtain a +2 average improvement of detection accuracy on Devign with only 3 out of 12 layers of CodeBERT and a 3.3x speed-up of fine-tuning. These findings show that early layers can be used to obtain better results using the same resources, as well as to reduce resource usage during fine-tuning and inference.

Surface defect detection is a critical task across numerous industries, aimed at efficiently identifying and localising imperfections or irregularities on manufactured components. While numerous methods have been proposed, many fail to meet industrial demands for high performance, efficiency, and adaptability. Existing approaches are often constrained to specific supervision scenarios and struggle to adapt to the diverse data annotations encountered in real-world manufacturing processes, such as unsupervised, weakly supervised, mixed supervision, and fully supervised settings. To address these challenges, we propose SuperSimpleNet, a highly efficient and adaptable discriminative model built on the foundation of SimpleNet. SuperSimpleNet incorporates a novel synthetic anomaly generation process, an enhanced classification head, and an improved learning procedure, enabling efficient training in all four supervision scenarios, making it the first model capable of fully leveraging all available data annotations. SuperSimpleNet sets a new standard for performance across all scenarios, as demonstrated by its results on four challenging benchmark datasets. Beyond accuracy, it is very fast, achieving an inference time below 10 ms. With its ability to unify diverse supervision paradigms while maintaining outstanding speed and reliability, SuperSimpleNet represents a promising step forward in addressing real-world manufacturing challenges and bridging the gap between academic research and industrial applications. Code: https://github.com/blaz-r/SuperSimpleNet

Pavement defect detection faces critical challenges including limited annotated data, domain shift between training and deployment environments, and high variability in defect appearances across different road conditions. We propose RoadFusion, a framework that addresses these limitations through synthetic anomaly generation with dual-path feature adaptation. A latent diffusion model synthesizes diverse, realistic defects using text prompts and spatial masks, enabling effective training under data scarcity. Two separate feature adaptors specialize representations for normal and anomalous inputs, improving robustness to domain shift and defect variability. A lightweight discriminator learns to distinguish fine-grained defect patterns at the patch level. Evaluated on six benchmark datasets, RoadFusion achieves consistently strong performance across both classification and localization tasks, setting new state-of-the-art in multiple metrics relevant to real-world road inspection.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Foundation models are becoming increasingly effective in the medical domain, offering pre-trained models on large datasets that can be readily adapted for downstream tasks. Despite progress, fetal ultrasound images remain a challenging domain for foundation models due to their inherent complexity, often requiring substantial additional training and facing limitations due to the scarcity of paired multimodal data. To overcome these challenges, here we introduce FetalCLIP, a vision-language foundation model capable of generating universal representation of fetal ultrasound images. FetalCLIP was pre-trained using a multimodal learning approach on a diverse dataset of 210,035 fetal ultrasound images paired with text. This represents the largest paired dataset of its kind used for foundation model development to date. This unique training approach allows FetalCLIP to effectively learn the intricate anatomical features present in fetal ultrasound images, resulting in robust representations that can be used for a variety of downstream applications. In extensive benchmarking across a range of key fetal ultrasound applications, including classification, gestational age estimation, congenital heart defect (CHD) detection, and fetal structure segmentation, FetalCLIP outperformed all baselines while demonstrating remarkable generalizability and strong performance even with limited labeled data. We plan to release the FetalCLIP model publicly for the benefit of the broader scientific community.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

Automatic visual inspection using machine learning plays a key role in achieving zero-defect policies in industry. Research on anomaly detection is constrained by the availability of datasets that capture complex defect appearances and imperfect imaging conditions, which are typical of production processes. Recent benchmarks indicate that most publicly available datasets are biased towards optimal imaging conditions, leading to an overestimation of their applicability in real-world industrial scenarios. To address this gap, we introduce the Industrial Screen Printing Anomaly Detection Dataset (ISP-AD). It presents challenging small and weakly contrasted surface defects embedded within structured patterns exhibiting high permitted design variability. To the best of our knowledge, it is the largest publicly available industrial dataset to date, including both synthetic and real defects collected directly from the factory floor. Beyond benchmarking recent unsupervised anomaly detection methods, experiments on a mixed supervised training strategy, incorporating both synthesized and real defects, were conducted. Experiments show that even a small amount of injected, weakly labeled real defects improves generalization. Furthermore, starting from training on purely synthetic defects, emerging real defective samples can be efficiently integrated into subsequent scalable training. Overall, our findings indicate that model-free synthetic defects can provide a cold-start baseline, whereas a small number of injected real defects refine the decision boundary for previously unseen defect characteristics. The presented unsupervised and supervised dataset splits are designed to emphasize research on unsupervised, self-supervised, and supervised approaches, enhancing their applicability to industrial settings.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

We introduce the first comprehensive 3D dataset for the task of unsupervised anomaly detection and localization. It is inspired by real-world visual inspection scenarios in which a model has to detect various types of defects on manufactured products, even if it is trained only on anomaly-free data. There are defects that manifest themselves as anomalies in the geometric structure of an object. These cause significant deviations in a 3D representation of the data. We employed a high-resolution industrial 3D sensor to acquire depth scans of 10 different object categories. For all object categories, we present a training and validation set, each of which solely consists of scans of anomaly-free samples. The corresponding test sets contain samples showing various defects such as scratches, dents, holes, contaminations, or deformations. Precise ground-truth annotations are provided for every anomalous test sample. An initial benchmark of 3D anomaly detection methods on our dataset indicates a considerable room for improvement.

Recent advancements in quality control across various industries have increasingly utilized the integration of video cameras and image processing for effective defect detection. A critical barrier to progress is the scarcity of comprehensive datasets featuring annotated defects, which are essential for developing and refining automated defect detection models. This systematic review, spanning from 2015 to 2023, identifies 15 publicly available datasets and critically examines them to assess their effectiveness and applicability for benchmarking and model development. Our findings reveal a diverse landscape of datasets, such as NEU-CLS, NEU-DET, DAGM, KolektorSDD, PCB Defect Dataset, and the Hollow Cylindrical Defect Detection Dataset, each with unique strengths and limitations in terms of image quality, defect type representation, and real-world applicability. The goal of this systematic review is to consolidate these datasets in a single location, providing researchers who seek such publicly available resources with a comprehensive reference.

In industrial settings, surface defects on steel can significantly compromise its service life and elevate potential safety risks. Traditional defect detection methods predominantly rely on manual inspection, which suffers from low efficiency and high costs. Although automated defect detection approaches based on Convolutional Neural Networks(e.g., Mask R-CNN) have advanced rapidly, their reliability remains challenged due to data annotation uncertainties during deep model training and overfitting issues. These limitations may lead to detection deviations when processing the given new test samples, rendering automated detection processes unreliable. To address this challenge, we first evaluate the detection model's practical performance through calibration data that satisfies the independent and identically distributed (i.i.d) condition with test data. Specifically, we define a loss function for each calibration sample to quantify detection error rates, such as the complement of recall rate and false discovery rate. Subsequently, we derive a statistically rigorous threshold based on a user-defined risk level to identify high-probability defective pixels in test images, thereby constructing prediction sets (e.g., defect regions). This methodology ensures that the expected error rate (mean error rate) on the test set remains strictly bounced by the predefined risk level. Additionally, we observe a negative correlation between the average prediction set size and the risk level on the test set, establishing a statistically rigorous metric for assessing detection model uncertainty. Furthermore, our study demonstrates robust and efficient control over the expected test set error rate across varying calibration-to-test partitioning ratios, validating the method's adaptability and operational effectiveness.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Within (semi-)automated visual industrial inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect patterns in pixel size on high-resolution imagery. The emergence of these often rarely occurring defect patterns explains the general need for labeled data corpora. To alleviate this issue and advance the current state of the art in unsupervised visual inspection, this work proposes a DifferNet-based solution enhanced with attention modules: AttentDifferNet. It improves image-level detection and classification capabilities on three visual anomaly detection datasets for industrial inspection: InsPLAD-fault, MVTec AD, and Semiconductor Wafer. In comparison to the state of the art, AttentDifferNet achieves improved results, which are, in turn, highlighted throughout our quali-quantitative study. Our quantitative evaluation shows an average improvement - compared to DifferNet - of 1.77 +/- 0.25 percentage points in overall AUROC considering all three datasets, reaching SOTA results in InsPLAD-fault, an industrial inspection in-the-wild dataset. As our variants to AttentDifferNet show great prospects in the context of currently investigated approaches, a baseline is formulated, emphasizing the importance of attention for industrial anomaly detection both in the wild and in controlled environments.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Anomaly Detection and Segmentation (AD&S) is crucial for industrial quality control. While existing methods excel in generating anomaly scores for each pixel, practical applications require producing a binary segmentation to identify anomalies. Due to the absence of labeled anomalies in many real scenarios, standard practices binarize these maps based on some statistics derived from a validation set containing only nominal samples, resulting in poor segmentation performance. This paper addresses this problem by proposing a test time training strategy to improve the segmentation performance. Indeed, at test time, we can extract rich features directly from anomalous samples to train a classifier that can discriminate defects effectively. Our general approach can work downstream to any AD&S method that provides an anomaly score map as output, even in multimodal settings. We demonstrate the effectiveness of our approach over baselines through extensive experimentation and evaluation on MVTec AD and MVTec 3D-AD.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

One persistent obstacle in industrial quality inspection is the detection of anomalies. In real-world use cases, two problems must be addressed: anomalous data is sparse and the same types of anomalies need to be detected on previously unseen objects. Current anomaly detection approaches can be trained with sparse nominal data, whereas domain generalization approaches enable detecting objects in previously unseen domains. Utilizing those two observations, we introduce the hybrid task of domain generalization on sparse classes. To introduce an accompanying dataset for this task, we present a modification of the well-established MVTec AD dataset by generating three new datasets. In addition to applying existing methods for benchmark, we design two embedding-based approaches, Spatial Embedding MLP (SEMLP) and Labeled PatchCore. Overall, SEMLP achieves the best performance with an average image-level AUROC of 87.2 % vs. 80.4 % by MIRO. The new and openly available datasets allow for further research to improve industrial anomaly detection.

In this work we investigate the ability of large language models to predict additive manufacturing defect regimes given a set of process parameter inputs. For this task we utilize a process parameter defect dataset to fine-tune a collection of models, titled AdditiveLLM, for the purpose of predicting potential defect regimes including Keyholing, Lack of Fusion, and Balling. We compare different methods of input formatting in order to gauge the model's performance to correctly predict defect regimes on our sparse Baseline dataset and our natural language Prompt dataset. The model displays robust predictive capability, achieving an accuracy of 93\% when asked to provide the defect regimes associated with a set of process parameters. The incorporation of natural language input further simplifies the task of process parameters selection, enabling users to identify optimal settings specific to their build.

We present a novel large-scale dataset for defect detection in a logistics setting. Recent work on industrial anomaly detection has primarily focused on manufacturing scenarios with highly controlled poses and a limited number of object categories. Existing benchmarks like MVTec-AD [6] and VisA [33] have reached saturation, with state-of-the-art methods achieving up to 99.9% AUROC scores. In contrast to manufacturing, anomaly detection in retail logistics faces new challenges, particularly in the diversity and variability of object pose and appearance. Leading anomaly detection methods fall short when applied to this new setting. To bridge this gap, we introduce a new benchmark that overcomes the current limitations of existing datasets. With over 230,000 images (and more than 29,000 defective instances), it is 40 times larger than MVTec-AD and contains more than 48,000 distinct objects. To validate the difficulty of the problem, we conduct an extensive evaluation of multiple state-of-the-art anomaly detection methods, demonstrating that they do not surpass 56.96% AUROC on our dataset. Further qualitative analysis confirms that existing methods struggle to leverage normal samples under heavy pose and appearance variation. With our large-scale dataset, we set a new benchmark and encourage future research towards solving this challenging problem in retail logistics anomaly detection. The dataset is available for download under https://www.kaputt-dataset.com.

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

Printed Circuit Boards are the foundation for the functioning of any electronic device, and therefore are an essential component for various industries such as automobile, communication, computation, etc. However, one of the challenges faced by the PCB manufacturers in the process of manufacturing of the PCBs is the faulty placement of its components including missing components. In the present scenario the infrastructure required to ensure adequate quality of the PCB requires a lot of time and effort. The authors present a novel solution for detecting missing components and classifying them in a resourceful manner. The presented algorithm focuses on pixel theory and object detection, which has been used in combination to optimize the results from the given dataset.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

We present WaferSAGE, a framework for wafer defect visual question answering using small vision-language models. To address data scarcity in semiconductor manufacturing, we propose a three-stage synthesis pipeline incorporating structured rubric generation for precise evaluation. Starting from limited labeled wafer maps, we employ clustering-based cleaning to filter label noise, then generate comprehensive defect descriptions using vision-language models, which are converted into structured evaluation rubrics criteria. These rubrics guide the synthesis of VQA pairs, ensuring coverage across defect type identification, spatial distribution, morphology, and root cause analysis. Our dual assessment framework aligns rule-based metrics with LLM-Judge scores via Bayesian optimization, enabling reliable automated evaluation. Through curriculum-based reinforcement learning with Group Sequence Policy Optimization (GSPO) and rubric-aligned rewards, our 4B-parameter Qwen3-VL model achieves a 6.493 LLM-Judge score, closely approaching Gemini-3-Flash (7.149) while enabling complete on-premise deployment. We demonstrate that small models with domain-specific training can surpass proprietary large models in specialized industrial visual understanding, offering a viable path for privacy-preserving, cost-effective deployment in semiconductor manufacturing.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Despite progress in vision-based inspection algorithms, real-world industrial challenges -- specifically in data availability, quality, and complex production requirements -- often remain under-addressed. We introduce the VISION Datasets, a diverse collection of 14 industrial inspection datasets, uniquely poised to meet these challenges. Unlike previous datasets, VISION brings versatility to defect detection, offering annotation masks across all splits and catering to various detection methodologies. Our datasets also feature instance-segmentation annotation, enabling precise defect identification. With a total of 18k images encompassing 44 defect types, VISION strives to mirror a wide range of real-world production scenarios. By supporting two ongoing challenge competitions on the VISION Datasets, we hope to foster further advancements in vision-based industrial inspection.

3D anomaly detection and localization is of great significance for industrial inspection. Prior 3D anomaly detection and localization methods focus on the setting that the testing data share the same category as the training data which is normal. However, in real-world applications, the normal training data for the target 3D objects can be unavailable due to issues like data privacy or export control regulation. To tackle these challenges, we identify a new task -- zero-shot 3D anomaly detection and localization, where the training and testing classes do not overlap. To this end, we design 3DzAL, a novel patch-level contrastive learning framework based on pseudo anomalies generated using the inductive bias from task-irrelevant 3D xyz data to learn more representative feature representations. Furthermore, we train a normalcy classifier network to classify the normal patches and pseudo anomalies and utilize the classification result jointly with feature distance to design anomaly scores. Instead of directly using the patch point clouds, we introduce adversarial perturbations to the input patch xyz data before feeding into the 3D normalcy classifier for the classification-based anomaly score. We show that 3DzAL outperforms the state-of-the-art anomaly detection and localization performance.

Solar energy is one of the most dependable renewable energy technologies, as it is feasible almost everywhere globally. However, improving the efficiency of a solar PV system remains a significant challenge. To enhance the robustness of the solar system, this paper proposes a trained convolutional neural network (CNN) based fault detection scheme to divide the images of photovoltaic modules. For binary classification, the algorithm classifies the input images of PV cells into two categories (i.e. faulty or normal). To further assess the network's capability, the defective PV cells are organized into shadowy, cracked, or dusty cells, and the model is utilized for multiple classifications. The success rate for the proposed CNN model is 91.1% for binary classification and 88.6% for multi-classification. Thus, the proposed trained CNN model remarkably outperforms the CNN model presented in a previous study which used the same datasets. The proposed CNN-based fault detection model is straightforward, simple and effective and could be applied in the fault detection of solar panel.

Internal defect detection constitutes a critical process in ensuring component quality, for which anomaly detection serves as an effective solution. However, existing anomaly detection datasets predominantly focus on surface defects in visible-light images, lacking publicly available X-ray datasets targeting internal defects in components. To address this gap, we construct the first publicly accessible component X-ray anomaly detection (CXR-AD) dataset, comprising real-world X-ray images. The dataset covers five industrial component categories, including 653 normal samples and 561 defect samples with precise pixel-level mask annotations. We systematically analyze the dataset characteristics and identify three major technical challenges: (1) strong coupling between complex internal structures and defect regions, (2) inherent low contrast and high noise interference in X-ray imaging, and (3) significant variations in defect scales and morphologies. To evaluate dataset complexity, we benchmark three state-of-the-art anomaly detection frameworks (feature-based, reconstruction-based, and zero-shot learning methods). Experimental results demonstrate a 29.78% average performance degradation on CXR-AD compared to MVTec AD, highlighting the limitations of current algorithms in handling internal defect detection tasks. To the best of our knowledge, CXR-AD represents the first publicly available X-ray dataset for component anomaly detection, providing a real-world industrial benchmark to advance algorithm development and enhance precision in internal defect inspection technologies.

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect scale and morphology, resulting in limited generalization, degraded realism, and category consistency. We address these challenges by introducing UDG, a large-scale dataset of 300K normal-abnormal-mask-caption quadruplets spanning diverse domains, and by presenting UniDG, a universal defect generation foundation model that supports both reference-based defect generation and text instruction-based defect editing without per-category fine-tuning. UniDG performs Defect-Context Editing via adaptive defect cropping and structured diptych input format, and fuses reference and target conditions through MM-DiT multimodal attention. A two-stage training strategy, Diversity-SFT followed by Consistency-RFT, further improves diversity while enhancing realism and reference consistency. Extensive experiments on MVTec-AD and VisA show that UniDG outperforms prior few-shot anomaly generation and image insertion/editing baselines in synthesis quality and downstream single- and multi-class anomaly detection/localization. Code will be available at https://github.com/RetoFan233/UniDG.

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Machine learning classification problems are widespread in bioinformatics, but the technical knowledge required to perform model training, optimization, and inference can prevent researchers from utilizing this technology. This article presents an automated tool for machine learning classification problems to simplify the process of training models and producing results while providing informative visualizations and insights into the data. This tool supports both binary and multiclass classification problems, and it provides access to a variety of models and methods. Synthetic data can be generated within the interface to fill missing values, balance class labels, or generate entirely new datasets. It also provides support for feature evaluation and generates explainability scores to indicate which features influence the output the most. We present CLASSify, an open-source tool for simplifying the user experience of solving classification problems without the need for knowledge of machine learning.

Industrial quality inspection plays a critical role in modern manufacturing by identifying defective products during production. While single-modality approaches using either 3D point clouds or 2D RGB images suffer from information incompleteness, multimodal anomaly detection offers promise through the complementary fusion of crossmodal data. However, existing methods face challenges in effectively integrating unimodal results and improving discriminative power. To address these limitations, we first reinterpret memory bank-based anomaly scores in single modalities as isotropic Euclidean distances in local feature spaces. Dynamically evolving from Euclidean metrics, we propose a novel Geometry-Guided Score Fusion (G^{2}SF) framework that progressively learns an anisotropic local distance metric as a unified score for the fusion task. Through a geometric encoding operator, a novel Local Scale Prediction Network (LSPN) is proposed to predict direction-aware scaling factors that characterize first-order local feature distributions, thereby enhancing discrimination between normal and anomalous patterns. Additionally, we develop specialized loss functions and score aggregation strategy from geometric priors to ensure both metric generalization and efficacy. Comprehensive evaluations on the MVTec-3D AD and Eyecandies datasets demonstrate the state-of-the-art detection performance of our method, and detailed ablation analysis validates each component's contribution. Our code is available at https://github.com/ctaoaa/G2SF.

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for manual intervention. In this paper, using SPI-extracted features of 6 million pins, we demonstrate a data-centric approach to train Machine Learning (ML) models to detect PCB defects at three stages of PCB manufacturing. The 6 million PCB pins correspond to 2 million components that belong to 15,387 PCBs. Using a base extreme gradient boosting (XGBoost) ML model, we iterate on the data pre-processing step to improve detection performance. Combining pin-level SPI features using component and PCB IDs, we developed training instances also at the component and PCB level. This allows the ML model to capture any inter-pin, inter-component, or spatial effects that may not be apparent at the pin level. Models are trained at the pin, component, and PCB levels, and the detection results from the different models are combined to identify defective components.

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in realworld manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions. Our approach leverages parallel memory banks that capture the distinct statistical properties of both normality and anomalous patterns, addressing the fundamental flaw of uniform outlier assumptions. To overcome data scarcity, we employ latent diffusion models with domain-specific textual conditioning, generating in-distribution synthetic defects that preserve industrial context. Our neighborhood-aware ratio scoring mechanism elegantly fuses complementary distance metrics, amplifying signals in regions exhibiting both deviation from normality and similarity to known defect patterns. Experimental validation on KSDD2 demonstrates superior performance (94.2% I-AUROC, 97.7% P-AUROC), with optimal augmentation at 100 synthetic samples.

Recent research has repeatedly shown that machine learning techniques can be applied to either whole files or file fragments to classify them for analysis. We build upon these techniques to show that for samples of un-labeled compiled computer object code, one can apply the same type of analysis to classify important aspects of the code, such as its target architecture and endianess. We show that using simple byte-value histograms we retain enough information about the opcodes within a sample to classify the target architecture with high accuracy, and then discuss heuristic-based features that exploit information within the operands to determine endianess. We introduce a dataset with over 16000 code samples from 20 architectures and experimentally show that by using our features, classifiers can achieve very high accuracy with relatively small sample sizes.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Visual anomaly detection is essential and commonly used for many tasks in the field of computer vision. Recent anomaly detection datasets mainly focus on industrial automated inspection, medical image analysis and video surveillance. In order to broaden the application and research of anomaly detection in unmanned supermarkets and smart manufacturing, we introduce the supermarket goods anomaly detection (GoodsAD) dataset. It contains 6124 high-resolution images of 484 different appearance goods divided into 6 categories. Each category contains several common different types of anomalies such as deformation, surface damage and opened. Anomalies contain both texture changes and structural changes. It follows the unsupervised setting and only normal (defect-free) images are used for training. Pixel-precise ground truth regions are provided for all anomalies. Moreover, we also conduct a thorough evaluation of current state-of-the-art unsupervised anomaly detection methods. This initial benchmark indicates that some methods which perform well on the industrial anomaly detection dataset (e.g., MVTec AD), show poor performance on our dataset. This is a comprehensive, multi-object dataset for supermarket goods anomaly detection that focuses on real-world applications.

Context: The SZZ algorithm is the de facto standard for labeling bug fixing commits and finding inducing changes for defect prediction data. Recent research uncovered potential problems in different parts of the SZZ algorithm. Most defect prediction data sets provide only static code metrics as features, while research indicates that other features are also important. Objective: We provide an empirical analysis of the defect labels created with the SZZ algorithm and the impact of commonly used features on results. Method: We used a combination of manual validation and adopted or improved heuristics for the collection of defect data. We conducted an empirical study on 398 releases of 38 Apache projects. Results: We found that only half of the bug fixing commits determined by SZZ are actually bug fixing. If a six-month time frame is used in combination with SZZ to determine which bugs affect a release, one file is incorrectly labeled as defective for every file that is correctly labeled as defective. In addition, two defective files are missed. We also explored the impact of the relatively small set of features that are available in most defect prediction data sets, as there are multiple publications that indicate that, e.g., churn related features are important for defect prediction. We found that the difference of using more features is not significant. Conclusion: Problems with inaccurate defect labels are a severe threat to the validity of the state of the art of defect prediction. Small feature sets seem to be a less severe threat.

In the past couple of decades, significant research efforts are devoted to the prediction of software bugs. However, most existing work in this domain treats all bugs the same, which is not the case in practice. It is important for a defect prediction method to estimate the severity of the identified bugs so that the higher-severity ones get immediate attention. In this study, we investigate source code metrics, source code representation using large language models (LLMs), and their combination in predicting bug severity labels of two prominent datasets. We leverage several source metrics at method-level granularity to train eight different machine-learning models. Our results suggest that Decision Tree and Random Forest models outperform other models regarding our several evaluation metrics. We then use the pre-trained CodeBERT LLM to study the source code representations' effectiveness in predicting bug severity. CodeBERT finetuning improves the bug severity prediction results significantly in the range of 29%-140% for several evaluation metrics, compared to the best classic prediction model on source code metric. Finally, we integrate source code metrics into CodeBERT as an additional input, using our two proposed architectures, which both enhance the CodeBERT model effectiveness.

While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this task challenging. This paper presents a procedural rendering pipeline that generates large-scale annotated synthetic training data using BlenderProc, with configurable material appearance, camera modes, and domain randomization, producing automatic COCO-format annotations. To show the potential of our approach, we evaluate four training strategies, namely synthetic-only, real-only, mixed, and fine-tuning from synthetic weights, across two objects with different material properties and three lightweight edge-deployable detectors, YOLOX, YOLO26, and LW-DETR. Our evaluation show that fine-tuning from synthetic weights consistently outperforms real-only training, and that mixed training effectively recovers performance under scarce real-data conditions, with findings validated across both convolutional and transformer-based architectures. The proposed approach enables scalable defect detection without the burden of large real annotated datasets, making it practical for on-device industrial inspection. The pipeline scripts, 3D model, and both synthetic and real annotated scratch datasets for a glossy toy Ferrari car will be made available through the project website upon acceptance.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

Industrial anomaly detection suffers from limited data, making cross-domain generalization particularly challenging. Generalist Anomaly Detection (GAD) aims to train a unified model on a source domain that can effectively detect anomalies in unseen target domains. In the initial semantic feature space, strong entanglement between anomalies and object categories or defect types hinders effective generalization across domains. Recent works address this issue by projecting features into a residual space; however, such methods primarily increase cross-domain overlap for normal features, while anomalous features remain specific to object categories, defect types and data domains, leading to poor alignment and generalization. To address this limitation, we propose Value-order Decomposition (VOD), a simple yet effective technique that bridges three types of generalization gaps across object categories, defect types (including real and synthetic defects), and data domains. VOD disentangles and suppresses object-category-, defect-type-, and domain-specific information, promoting alignment within normal and abnormal samples while preserving their separability, thereby enabling robust generalization across the three gaps. Leveraging the strong alignment between real and synthetic defects within the same object, we perform anomaly detection using only normal and synthetic-abnormal reference, and effectively generalize to unseen real defect types. Experiments on diverse industrial and medical benchmarks demonstrate that our method, using a simple cut-and-paste anomaly simulation strategy, achieves strong generalization across the three gaps.

Visual anomaly detection is commonly used in industrial quality inspection. In this paper, we present a new dataset as well as a new self-supervised learning method for ImageNet pre-training to improve anomaly detection and segmentation in 1-class and 2-class 5/10/high-shot training setups. We release the Visual Anomaly (VisA) Dataset consisting of 10,821 high-resolution color images (9,621 normal and 1,200 anomalous samples) covering 12 objects in 3 domains, making it the largest industrial anomaly detection dataset to date. Both image and pixel-level labels are provided. We also propose a new self-supervised framework - SPot-the-difference (SPD) - which can regularize contrastive self-supervised pre-training, such as SimSiam, MoCo and SimCLR, to be more suitable for anomaly detection tasks. Our experiments on VisA and MVTec-AD dataset show that SPD consistently improves these contrastive pre-training baselines and even the supervised pre-training. For example, SPD improves Area Under the Precision-Recall curve (AU-PR) for anomaly segmentation by 5.9% and 6.8% over SimSiam and supervised pre-training respectively in the 2-class high-shot regime. We open-source the project at http://github.com/amazon-research/spot-diff .

Accurate defect segmentation is critical for industrial inspection, yet dense pixel-level annotations are rarely available. A common workaround is to convert inexpensive bounding boxes into pseudo-masks using foundation segmentation models such as the Segment Anything Model (SAM). However, these pseudo-labels are systematically noisy on industrial surfaces, often hallucinating background structure while missing sparse defects. To address this limitation, a noise-robust box-to-pixel distillation framework, Boxes2Pixels, is proposed that treats SAM as a noisy teacher rather than a source of ground-truth supervision. Bounding boxes are converted into pseudo-masks offline by SAM, and a compact student is trained with (i) a hierarchical decoder over frozen DINOv2 features for semantic stability, (ii) an auxiliary binary localization head to decouple sparse foreground discovery from class prediction, and (iii) a one-sided online self-correction mechanism that relaxes background supervision when the student is confident, targeting teacher false negatives. On a manually annotated wind turbine inspection benchmark, the proposed Boxes2Pixels improves anomaly mIoU by +6.97 and binary IoU by +9.71 over the strongest baseline trained under identical weak supervision. Moreover, online self-correction increases the binary recall by +18.56, while the model employs 80\% fewer trainable parameters. Code is available at https://github.com/CLendering/Boxes2Pixels.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

In this work we explore the application of AI to robotic welding. Robotic welding is a widely used technology in many industries, but robots currently do not have the capability to detect welding defects which get introduced due to various reasons in the welding process. We describe how deep-learning methods can be applied to detect weld defects in real-time by recording the welding process with microphones and a camera. Our findings are based on a large database with more than 4000 welding samples we collected which covers different weld types, materials and various defect categories. All deep learning models are trained in an unsupervised fashion because the space of possible defects is large and the defects in our data may contain biases. We demonstrate that a reliable real-time detection of most categories of weld defects is feasible both from audio and video, with improvements achieved by combining both modalities. Specifically, the multi-modal approach achieves an average Area-under-ROC-Curve (AUC) of 0.92 over all eleven defect types in our data. We conclude the paper with an analysis of the results by defect type and a discussion of future work.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

Zero-shot anomaly classification (AC) and segmentation (AS) methods aim to identify and outline defects without using any labeled samples. In this paper, we reveal a key property that is overlooked by existing methods: normal image patches across industrial products typically find many other similar patches, not only in 2D appearance but also in 3D shapes, while anomalies remain diverse and isolated. To explicitly leverage this discriminative property, we propose a Mutual Scoring framework (MuSc-V2) for zero-shot AC/AS, which flexibly supports single 2D/3D or multimodality. Specifically, our method begins by improving 3D representation through Iterative Point Grouping (IPG), which reduces false positives from discontinuous surfaces. Then we use Similarity Neighborhood Aggregation with Multi-Degrees (SNAMD) to fuse 2D/3D neighborhood cues into more discriminative multi-scale patch features for mutual scoring. The core comprises a Mutual Scoring Mechanism (MSM) that lets samples within each modality to assign score to each other, and Cross-modal Anomaly Enhancement (CAE) that fuses 2D and 3D scores to recover modality-specific missing anomalies. Finally, Re-scoring with Constrained Neighborhood (RsCon) suppresses false classification based on similarity to more representative samples. Our framework flexibly works on both the full dataset and smaller subsets with consistently robust performance, ensuring seamless adaptability across diverse product lines. In aid of the novel framework, MuSc-V2 achieves significant performance improvements: a +23.7% AP gain on the MVTec 3D-AD dataset and a +19.3% boost on the Eyecandies dataset, surpassing previous zero-shot benchmarks and even outperforming most few-shot methods. The code will be available at The code will be available at https://github.com/HUST-SLOW/MuSc-V2{https://github.com/HUST-SLOW/MuSc-V2}.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Detecting defects in real-world industrial inspection often requires learning from only a few normal images per category. Recent few-shot anomaly detection methods have achieved strong performance by measuring feature differences between query images and normal references. However, visual differences do not always indicate genuine defects, as normal appearance variations can also produce high anomaly scores. Conversely, structural or logical anomalies may not produce strong local feature differences, making them difficult to detect. To address this limitation, we introduce VerdictAD, a training-free framework that refines existing anomaly detectors through visual decisions. Rather than replacing existing detectors, VerdictAD adopts a typed decision model to assess the query image and its local regions against a few normal references. By directly producing structured decision probabilities without text generation, the model provides complementary evidence for refining anomaly responses at different spatial scales. Building on this capability, we introduce two modules: Global Verdict Refinement (GVR) uses image-level decisions to refine the overall anomaly score, while Local Verdict Refinement (LVR) aggregates regional decisions to refine the anomaly map. Combined with a simple DINOv2-based detector, VerdictAD achieves competitive performance in one-shot and few-shot anomaly detection. More importantly, as a plug-and-play framework, it consistently improves existing anomaly detectors across MVTec AD, VisA, and MVTec LOCO AD, achieving strong results across one-shot and few-shot settings. Our code and experimental logs are publicly available at https://github.com/sgstq0811/VerdictAD-Jev-AD.

In today's digital landscape, the importance of timely and accurate vulnerability detection has significantly increased. This paper presents a novel approach that leverages transformer-based models and machine learning techniques to automate the identification of software vulnerabilities by analyzing GitHub issues. We introduce a new dataset specifically designed for classifying GitHub issues relevant to vulnerability detection. We then examine various classification techniques to determine their effectiveness. The results demonstrate the potential of this approach for real-world application in early vulnerability detection, which could substantially reduce the window of exploitation for software vulnerabilities. This research makes a key contribution to the field by providing a scalable and computationally efficient framework for automated detection, enabling the prevention of compromised software usage before official notifications. This work has the potential to enhance the security of open-source software ecosystems.

Code contains security and functional bugs. The process of identifying and localizing them is difficult and relies on human labor. In this work, we present a novel approach (FLAG) to assist human debuggers. FLAG is based on the lexical capabilities of generative AI, specifically, Large Language Models (LLMs). Here, we input a code file then extract and regenerate each line within that file for self-comparison. By comparing the original code with an LLM-generated alternative, we can flag notable differences as anomalies for further inspection, with features such as distance from comments and LLM confidence also aiding this classification. This reduces the inspection search space for the designer. Unlike other automated approaches in this area, FLAG is language-agnostic, can work on incomplete (and even non-compiling) code and requires no creation of security properties, functional tests or definition of rules. In this work, we explore the features that help LLMs in this classification and evaluate the performance of FLAG on known bugs. We use 121 benchmarks across C, Python and Verilog; with each benchmark containing a known security or functional weakness. We conduct the experiments using two state of the art LLMs in OpenAI's code-davinci-002 and gpt-3.5-turbo, but our approach may be used by other models. FLAG can identify 101 of the defects and helps reduce the search space to 12-17% of source code.

The field of industrial defect detection using machine learning and deep learning is a subject of active research. Datasets, also called benchmarks, are used to compare and assess research results. There is a number of datasets in industrial visual inspection, of varying quality. Thus, it is a difficult task to determine which dataset to use. Generally speaking, datasets which include a testing set, with precise labeling and made in real-world conditions should be preferred. We propose a study of existing benchmarks to compare and expose their characteristics and their use-cases. A study of industrial metrics requirements, as well as testing procedures, will be presented and applied to the studied benchmarks. We discuss our findings by examining the current state of benchmarks for industrial visual inspection, and by exposing guidelines on the usage of benchmarks.

Unsupervised anomaly in industry has been a concerning topic and a stepping stone for high performance industrial automation process. The vast majority of industry-oriented methods focus on learning from good samples to detect anomaly notwithstanding some specific industrial scenario requiring even less specific training and therefore a generalization for anomaly detection. The obvious use case is the fabric anomaly detection, where we have to deal with a really wide range of colors and types of textile and a stoppage of the production line for training could not be considered. In this paper, we propose an automation process for industrial fabric texture defect detection with a specificity-learning process during the domain-generalized anomaly detection. Combining the ability to generalize and the learning process offer a fast and precise anomaly detection and segmentation. The main contributions of this paper are the following: A domain-generalization texture anomaly detection method achieving the state-of-the-art performances, a fast specific training on good samples extracted by the proposed method, a self-evaluation method based on custom defect creation and an automatic detection of already seen fabric to prevent re-training.

Reliable classification of 3D-printed objects is essential for automating post-production workflows in industrial additive manufacturing. Despite extensive automation in other stages of the printing pipeline, this task still relies heavily on manual inspection, as the set of objects to be classified can change daily, making frequent model retraining impractical. Automating the identification step is therefore critical for improving operational efficiency. A vision model that could classify any set of objects by utilizing their corresponding CAD models and avoiding retraining would be highly beneficial in this setting. To enable systematic evaluation of vision models on this task, we introduce ThingiPrint, a new publicly available dataset that pairs CAD models with real photographs of their 3D-printed counterparts. Using ThingiPrint, we benchmark a range of existing vision models on the task of 3D-printed object classification. We additionally show that contrastive fine-tuning with a rotation-invariant objective allows effective prototype-based classification of previously unseen 3D-printed objects. By relying solely on the available CAD models, this avoids the need for retraining when new objects are introduced. Experiments show that this approach outperforms standard pretrained baselines, suggesting improved generalization and practical relevance for real-world use.

The presence of point defects such as vacancies plays an important role in material design. Here, we demonstrate that a graph neural network (GNN) model trained only on perfect materials can also be used to predict vacancy formation energies (E_{vac}) of defect structures without the need for additional training data. Such GNN-based predictions are considerably faster than density functional theory (DFT) calculations with reasonable accuracy and show the potential that GNNs are able to capture a functional form for energy predictions. To test this strategy, we developed a DFT dataset of 508 E_{vac} consisting of 3D elemental solids, alloys, oxides, nitrides, and 2D monolayer materials. We analyzed and discussed the applicability of such direct and fast predictions. We applied the model to predict 192494 E_{vac} for 55723 materials in the JARVIS-DFT database.

Large language models (LLMs) have demonstrated rapid progress across a wide array of domains. Owing to the very large number of parameters and training data in LLMs, these models inherently encompass an expansive and comprehensive materials knowledge database, far exceeding the capabilities of individual researcher. Nonetheless, devising methods to harness the knowledge embedded within LLMs for the design and discovery of novel materials remains a formidable challenge. We introduce a general approach for addressing materials classification problems, which incorporates LLMs, prompt engineering, and deep learning. Utilizing a dataset of metallic glasses as a case study, our methodology achieved an improvement of up to 463% in prediction accuracy compared to conventional classification models. These findings underscore the potential of leveraging textual knowledge generated by LLMs for materials especially in the common situation where datasets are sparse, thereby promoting innovation in materials discovery and design.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

Visual anomaly detection plays a crucial role in not only manufacturing inspection to find defects of products during manufacturing processes, but also maintenance inspection to keep equipment in optimum working condition particularly outdoors. Due to the scarcity of the defective samples, unsupervised anomaly detection has attracted great attention in recent years. However, existing datasets for unsupervised anomaly detection are biased towards manufacturing inspection, not considering maintenance inspection which is usually conducted under outdoor uncontrolled environment such as varying camera viewpoints, messy background and degradation of object surface after long-term working. We focus on outdoor maintenance inspection and contribute a comprehensive Maintenance Inspection Anomaly Detection (MIAD) dataset which contains more than 100K high-resolution color images in various outdoor industrial scenarios. This dataset is generated by a 3D graphics software and covers both surface and logical anomalies with pixel-precise ground truth. Extensive evaluations of representative algorithms for unsupervised anomaly detection are conducted, and we expect MIAD and corresponding experimental results can inspire research community in outdoor unsupervised anomaly detection tasks. Worthwhile and related future work can be spawned from our new dataset.

Recently, multi-class anomaly classification has garnered increasing attention. Previous methods directly cluster anomalies but often struggle due to the lack of anomaly-prior knowledge. Acquiring this knowledge faces two issues: the non-prominent and weak-semantics anomalies. In this paper, we propose AnomalyNCD, a multi-class anomaly classification network compatible with different anomaly detection methods. To address the non-prominence of anomalies, we design main element binarization (MEBin) to obtain anomaly-centered images, ensuring anomalies are learned while avoiding the impact of incorrect detections. Next, to learn anomalies with weak semantics, we design mask-guided representation learning, which focuses on isolated anomalies guided by masks and reduces confusion from erroneous inputs through corrected pseudo labels. Finally, to enable flexible classification at both region and image levels, we develop a region merging strategy that determines the overall image category based on the classified anomaly regions. Our method outperforms the state-of-the-art works on the MVTec AD and MTD datasets. Compared with the current methods, AnomalyNCD combined with zero-shot anomaly detection method achieves a 10.8% F_1 gain, 8.8% NMI gain, and 9.5% ARI gain on MVTec AD, and 12.8% F_1 gain, 5.7% NMI gain, and 10.8% ARI gain on MTD. Code is available at https://github.com/HUST-SLOW/AnomalyNCD.

Anomaly detection is a critical task in industrial manufacturing, aiming to identify defective parts of products. Most industrial anomaly detection methods assume the availability of sufficient normal data for training. This assumption may not hold true due to the cost of labeling or data privacy policies. Additionally, mainstream methods require training bespoke models for different objects, which incurs heavy costs and lacks flexibility in practice. To address these issues, we seek help from Stable Diffusion (SD) model due to its capability of zero/few-shot inpainting, which can be leveraged to inpaint anomalous regions as normal. In this paper, a few-shot multi-class anomaly detection framework that adopts Stable Diffusion model is proposed, named AnomalySD. To adapt SD to anomaly detection task, we design different hierarchical text descriptions and the foreground mask mechanism for fine-tuning SD. In the inference stage, to accurately mask anomalous regions for inpainting, we propose multi-scale mask strategy and prototype-guided mask strategy to handle diverse anomalous regions. Hierarchical text prompts are also utilized to guide the process of inpainting in the inference stage. The anomaly score is estimated based on inpainting result of all masks. Extensive experiments on the MVTec-AD and VisA datasets demonstrate the superiority of our approach. We achieved anomaly classification and segmentation results of 93.6%/94.8% AUROC on the MVTec-AD dataset and 86.1%/96.5% AUROC on the VisA dataset under multi-class and one-shot settings.

Modern language models (LMs) have been successfully employed in source code generation and understanding, leading to a significant increase in research focused on learning-based code intelligence, such as automated bug repair, and test case generation. Despite their great potential, language models for code intelligence (LM4Code) are susceptible to potential pitfalls, which hinder realistic performance and further impact their reliability and applicability in real-world deployment. Such challenges drive the need for a comprehensive understanding - not just identifying these issues but delving into their possible implications and existing solutions to build more reliable language models tailored to code intelligence. Based on a well-defined systematic research approach, we conducted an extensive literature review to uncover the pitfalls inherent in LM4Code. Finally, 67 primary studies from top-tier venues have been identified. After carefully examining these studies, we designed a taxonomy of pitfalls in LM4Code research and conducted a systematic study to summarize the issues, implications, current solutions, and challenges of different pitfalls for LM4Code systems. We developed a comprehensive classification scheme that dissects pitfalls across four crucial aspects: data collection and labeling, system design and learning, performance evaluation, and deployment and maintenance. Through this study, we aim to provide a roadmap for researchers and practitioners, facilitating their understanding and utilization of LM4Code in reliable and trustworthy ways.

Deep neural networks show great potential for automating various visual quality inspection tasks in manufacturing. However, their applicability is limited in more volatile scenarios, such as remanufacturing, where the inspected products and defect patterns often change. In such settings, deployed models require frequent adaptation to novel conditions, effectively posing a continual learning problem. To enable quick adaptation, the necessary training processes must be computationally efficient while still avoiding effects like catastrophic forgetting. This work presents a multi-level feature fusion (MLFF) approach that aims to improve both aspects simultaneously by utilizing representations from different depths of a pretrained network. We show that our approach is able to match the performance of end-to-end training for different quality inspection problems while using significantly less trainable parameters. Furthermore, it reduces catastrophic forgetting and improves generalization robustness to new product types or defects.

Enhancing yield is recognized as a paramount driver to reducing production costs in semiconductor smart manufacturing. However, optimizing and ensuring high yield rates is a highly complex and technical challenge, especially while maintaining reliable yield diagnosis and prognosis, and this shall require understanding all the confounding factors in a complex condition. This study proposes a domain-specific explainable automated machine learning technique (termed xAutoML), which autonomously self-learns the optimal models for yield prediction, with an extent of explainability, and also provides insights on key diagnosis factors. The xAutoML incorporates tailored problem-solving functionalities in an auto-optimization pipeline to address the intricacies of semiconductor yield enhancement. Firstly, to capture the key diagnosis factors, knowledge-informed feature extraction coupled with model-agnostic key feature selection is designed. Secondly, combined algorithm selection and hyperparameter tuning with adaptive loss are developed to generate optimized classifiers for better defect prediction, and adaptively evolve in response to shifting data patterns. Moreover, a suite of explainability tools is provided throughout the AutoML pipeline, enhancing user understanding and fostering trust in the automated processes. The proposed xAutoML exhibits superior performance, with domain-specific refined countermeasures, adaptive optimization capabilities, and embedded explainability. Findings exhibit that the proposed xAutoML is a compelling solution for semiconductor yield improvement, defect diagnosis, and related applications.

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

In this paper, the concept of representation learning based on deep neural networks is applied as an alternative to the use of handcrafted features in a method for automatic visual inspection of corroded thermoelectric metallic pipes. A texture convolutional neural network (TCNN) replaces handcrafted features based on Local Phase Quantization (LPQ) and Haralick descriptors (HD) with the advantage of learning an appropriate textural representation and the decision boundaries into a single optimization process. Experimental results have shown that it is possible to reach the accuracy of 99.20% in the task of identifying different levels of corrosion in the internal surface of thermoelectric pipe walls, while using a compact network that requires much less effort in tuning parameters when compared to the handcrafted approach since the TCNN architecture is compact regarding the number of layers and connections. The observed results open up the possibility of using deep neural networks in real-time applications such as the automatic inspection of thermoelectric metal pipes.

Induction motors are one of the most crucial electrical equipment and are extensively used in industries in a wide range of applications. This paper presents a machine learning model for the fault detection and classification of induction motor faults by using three phase voltages and currents as inputs. The aim of this work is to protect vital electrical components and to prevent abnormal event progression through early detection and diagnosis. This work presents a fast forward artificial neural network model to detect some of the commonly occurring electrical faults like overvoltage, under voltage, single phasing, unbalanced voltage, overload, ground fault. A separate model free monitoring system wherein the motor itself acts like a sensor is presented and the only monitored signals are the input given to the motor. Limits for current and voltage values are set for the faulty and healthy conditions, which is done by a classifier. Real time data from a 0.33 HP induction motor is used to train and test the neural network. The model so developed analyses the voltage and current values given at a particular instant and classifies the data into no fault or the specific fault. The model is then interfaced with a real motor to accurately detect and classify the faults so that further necessary action can be taken.

This study introduces the Iterative Refinement Process (IRP), a robust anomaly detection methodology designed for high-stakes industrial quality control. The IRP enhances defect detection accuracy through a cyclic data refinement strategy, iteratively removing misleading data points to improve model performance and robustness. We validate the IRP's effectiveness using two benchmark datasets, Kolektor SDD2 (KSDD2) and MVTec AD, covering a wide range of industrial products and defect types. Our experimental results demonstrate that the IRP consistently outperforms traditional anomaly detection models, particularly in environments with high noise levels. This study highlights the IRP's potential to significantly enhance anomaly detection processes in industrial settings, effectively managing the challenges of sparse and noisy data.

Large-scale Visual-Language Models (LVLMs) have achieved remarkable success in natural visual tasks, yet their application to industrial defect detection remains challenging due to two fundamental limitations: (i) the scarcity of large-scale industrial datasets that cover diverse defect categories across multiple domains, and (ii) the reliance on manual prompts (points, boxes, masks) that introduce subjective noise and lack text-visual interaction for fine-grained understanding. To address these challenges, we introduce a Large-Scale Multi-Modal Industrial Open-Closed benchmark (MMIOC-1M) containing over one million samples across 14 super-categories, 29 industrial scenes, and 351 defect subcategories. To our knowledge, MMIOC-1M is the first unified largest benchmark supporting both open-vocabulary and closed-set industrial detection, providing valuable pre-training data for LVLMs in industrial scenarios. Furthermore, we propose a Refined Text-Visual Prompt Network (RTVPNet) that incorporates three key innovations: (1) an expert-assisted domain projection mechanism that enables rapid adaptation of general vision models to industrial domains, (2) an energy-based sparse sampling strategy that automatically generates refined visual prompts without manual intervention, and (3) a bidirectional text-visual interaction module that enhances cross-modal semantic alignment and understanding. Extensive experiments demonstrate that RTVPNet achieves state-of-the-art performance on MMIOC-1M, LVIS, and COCO benchmarks while maintaining computational efficiency. The dataset and code are available at https://github.com/hellozzk/MMIO.

Anomaly detection plays a key role in industrial manufacturing for product quality control. Traditional methods for anomaly detection are rule-based with limited generalization ability. Recent methods based on supervised deep learning are more powerful but require large-scale annotated datasets for training. In practice, abnormal products are rare thus it is very difficult to train a deep model in a fully supervised way. In this paper, we propose a novel unsupervised anomaly detection approach based on Self-organizing Map (SOM). Our method, Self-organizing Map for Anomaly Detection (SOMAD) maintains normal characteristics by using topological memory based on multi-scale features. SOMAD achieves state-of the-art performance on unsupervised anomaly detection and localization on the MVTec dataset.

This study proposes a two-phase methodology for detecting and classifying auxiliary insulation in structural components. In the detection phase, a YOLOv8x model is trained on a dataset of complete structural blueprints, each annotated with bounding boxes indicating areas that should contain insulation. In the classification phase, these detected insulation patches are cropped and categorized into two classes: present or missing. These are then used to train a YOLOv8x-CLS model that determines the presence or absence of auxiliary insulation. Preprocessing steps for both datasets included annotation, augmentation, and appropriate cropping of the insulation regions. The detection model achieved a mean average precision (mAP) score of 82%, while the classification model attained an accuracy of 98%. These findings demonstrate the effectiveness of the proposed approach in automating insulation detection and classification, providing a foundation for further advancements in this domain.

Recent advances in Hierarchical Multi-label Classification (HMC), particularly neurosymbolic-based approaches, have demonstrated improved consistency and accuracy by enforcing constraints on a neural model during training. However, such work assumes the existence of such constraints a-priori. In this paper, we relax this strong assumption and present an approach based on Error Detection Rules (EDR) that allow for learning explainable rules about the failure modes of machine learning models. We show that these rules are not only effective in detecting when a machine learning classifier has made an error but also can be leveraged as constraints for HMC, thereby allowing the recovery of explainable constraints even if they are not provided. We show that our approach is effective in detecting machine learning errors and recovering constraints, is noise tolerant, and can function as a source of knowledge for neurosymbolic models on multiple datasets, including a newly introduced military vehicle recognition dataset.

Despite generating increasingly photorealistic images, text-to-image (T2I) models still exhibit localized, subtle, and structurally complex failures. Diagnosing these failures requires instance-level feedback that answers where a defect occurs, what type it is, why it is defective, and its importance to overall image quality. While recent dense-feedback methods move beyond scalar supervision, their heatmap-centric representations still formulate diagnosis as pixel-field regression, making it difficult to localize variable-cardinality defects and bind semantic reasons to individual failures. To address this representation bottleneck, we propose Structured Defect Grounding (SDG), which casts T2I diagnosis as structured set prediction by modeling each defect as a (location, type, reason, importance) tuple. To make this formulation trainable and measurable, we introduce SDG-30K, a 30K-image dataset with box-grounded annotations across four modern T2I generators, together with a dedicated evaluation protocol, SDG-Eval. Building on this structured representation, we further present a diagnosis-to-alignment framework in which a Vision-Language Model (VLM) serves as the SDG detector, and BoxFlow-GRPO converts predicted defect sets into box-derived, importance-weighted spatial rewards for diffusion model alignment. Extensive experiments show that our SDG detector outperforms leading proprietary VLMs on structured defect grounding, while SDG-guided rewards consistently improve T2I alignment and support localized image refinement. These results establish SDG as a unified, instance-level interface for diagnosing, evaluating, and enhancing modern generative models.

An approach to the construction of classifiers from imbalanced datasets is described. A dataset is imbalanced if the classification categories are not approximately equally represented. Often real-world data sets are predominately composed of "normal" examples with only a small percentage of "abnormal" or "interesting" examples. It is also the case that the cost of misclassifying an abnormal (interesting) example as a normal example is often much higher than the cost of the reverse error. Under-sampling of the majority (normal) class has been proposed as a good means of increasing the sensitivity of a classifier to the minority class. This paper shows that a combination of our method of over-sampling the minority (abnormal) class and under-sampling the majority (normal) class can achieve better classifier performance (in ROC space) than only under-sampling the majority class. This paper also shows that a combination of our method of over-sampling the minority class and under-sampling the majority class can achieve better classifier performance (in ROC space) than varying the loss ratios in Ripper or class priors in Naive Bayes. Our method of over-sampling the minority class involves creating synthetic minority class examples. Experiments are performed using C4.5, Ripper and a Naive Bayes classifier. The method is evaluated using the area under the Receiver Operating Characteristic curve (AUC) and the ROC convex hull strategy.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

Characterizing samples that are difficult to learn from is crucial to developing highly performant ML models. This has led to numerous Hardness Characterization Methods (HCMs) that aim to identify "hard" samples. However, there is a lack of consensus regarding the definition and evaluation of "hardness". Unfortunately, current HCMs have only been evaluated on specific types of hardness and often only qualitatively or with respect to downstream performance, overlooking the fundamental quantitative identification task. We address this gap by presenting a fine-grained taxonomy of hardness types. Additionally, we propose the Hardness Characterization Analysis Toolkit (H-CAT), which supports comprehensive and quantitative benchmarking of HCMs across the hardness taxonomy and can easily be extended to new HCMs, hardness types, and datasets. We use H-CAT to evaluate 13 different HCMs across 8 hardness types. This comprehensive evaluation encompassing over 14K setups uncovers strengths and weaknesses of different HCMs, leading to practical tips to guide HCM selection and future development. Our findings highlight the need for more comprehensive HCM evaluation, while we hope our hardness taxonomy and toolkit will advance the principled evaluation and uptake of data-centric AI methods.

Static analysis tools are widely used for vulnerability detection as they understand programs with complex behavior and millions of lines of code. Despite their popularity, static analysis tools are known to generate an excess of false positives. The recent ability of Machine Learning models to understand programming languages opens new possibilities when applied to static analysis. However, existing datasets to train models for vulnerability identification suffer from multiple limitations such as limited bug context, limited size, and synthetic and unrealistic source code. We propose D2A, a differential analysis based approach to label issues reported by static analysis tools. The D2A dataset is built by analyzing version pairs from multiple open source projects. From each project, we select bug fixing commits and we run static analysis on the versions before and after such commits. If some issues detected in a before-commit version disappear in the corresponding after-commit version, they are very likely to be real bugs that got fixed by the commit. We use D2A to generate a large labeled dataset to train models for vulnerability identification. We show that the dataset can be used to build a classifier to identify possible false alarms among the issues reported by static analysis, hence helping developers prioritize and investigate potential true positives first.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Visual anomaly classification and segmentation are vital for automating industrial quality inspection. The focus of prior research in the field has been on training custom models for each quality inspection task, which requires task-specific images and annotation. In this paper we move away from this regime, addressing zero-shot and few-normal-shot anomaly classification and segmentation. Recently CLIP, a vision-language model, has shown revolutionary generality with competitive zero-/few-shot performance in comparison to full-supervision. But CLIP falls short on anomaly classification and segmentation tasks. Hence, we propose window-based CLIP (WinCLIP) with (1) a compositional ensemble on state words and prompt templates and (2) efficient extraction and aggregation of window/patch/image-level features aligned with text. We also propose its few-normal-shot extension WinCLIP+, which uses complementary information from normal images. In MVTec-AD (and VisA), without further tuning, WinCLIP achieves 91.8%/85.1% (78.1%/79.6%) AUROC in zero-shot anomaly classification and segmentation while WinCLIP+ does 93.1%/95.2% (83.8%/96.4%) in 1-normal-shot, surpassing state-of-the-art by large margins.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

The drone has been used for various purposes, including military applications, aerial photography, and pesticide spraying. However, the drone is vulnerable to external disturbances, and malfunction in propellers and motors can easily occur. To improve the safety of drone operations, one should detect the mechanical faults of drones in real-time. This paper proposes a sound-based deep neural network (DNN) fault classifier and drone sound dataset. The dataset was constructed by collecting the operating sounds of drones from microphones mounted on three different drones in an anechoic chamber. The dataset includes various operating conditions of drones, such as flight directions (front, back, right, left, clockwise, counterclockwise) and faults on propellers and motors. The drone sounds were then mixed with noises recorded in five different spots on the university campus, with a signal-to-noise ratio (SNR) varying from 10 dB to 15 dB. Using the acquired dataset, we train a DNN classifier, 1DCNN-ResNet, that classifies the types of mechanical faults and their locations from short-time input waveforms. We employ multitask learning (MTL) and incorporate the direction classification task as an auxiliary task to make the classifier learn more general audio features. The test over unseen data reveals that the proposed multitask model can successfully classify faults in drones and outperforms single-task models even with less training data.

Anomaly detection (AD) plays an important role in various real-world applications. Recent advancements in AD, however, are often biased towards industrial inspection, struggle to generalize to broader tasks like semantic anomaly detection and vice versa. Although recent methods have attempted to address general anomaly detection, their performance remains sensitive to dataset-specific settings and single-class tasks. In this paper, we propose a novel dual-model ensemble approach based on knowledge distillation (KD) to bridge this gap. Our framework consists of a teacher and two student models: an Encoder-Decoder model, specialized in detecting patch-level minor defects for industrial AD and an Encoder-Encoder model, optimized for semantic AD. Both models leverage a shared pre-trained encoder (DINOv2) to extract high-quality feature representations. The dual models are jointly learned using the Noisy-OR objective, and the final anomaly score is obtained using the joint probability via local and semantic anomaly scores derived from the respective models. We evaluate our method on eight public benchmarks under both single-class and multi-class settings: MVTec-AD, MVTec-LOCO, VisA and Real-IAD for industrial inspection and CIFAR-10/100, FMNIST and View for semantic anomaly detection. The proposed method achieved state-of-the-art accuracies in both domains, in multi-class as well as single-class settings, demonstrating generalization across multiple domains of anomaly detection. Our model achieved an image-level AUROC of 99.7% on MVTec-AD and 97.8% on CIFAR-10, which is significantly better than the prior general AD models in multi-class settings and even higher than the best specialist models on individual benchmarks.

The aim of surface defect detection is to identify and localise abnormal regions on the surfaces of captured objects, a task that's increasingly demanded across various industries. Current approaches frequently fail to fulfil the extensive demands of these industries, which encompass high performance, consistency, and fast operation, along with the capacity to leverage the entirety of the available training data. Addressing these gaps, we introduce SuperSimpleNet, an innovative discriminative model that evolved from SimpleNet. This advanced model significantly enhances its predecessor's training consistency, inference time, as well as detection performance. SuperSimpleNet operates in an unsupervised manner using only normal training images but also benefits from labelled abnormal training images when they are available. SuperSimpleNet achieves state-of-the-art results in both the supervised and the unsupervised settings, as demonstrated by experiments across four challenging benchmark datasets. Code: https://github.com/blaz-r/SuperSimpleNet .

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

Large Language Models (LLMs) have become key components of modern software, with prompts acting as their de-facto programming interface. However, prompt design remains largely empirical and small mistakes can cascade into unreliable, insecure, or inefficient behavior. This paper presents the first systematic survey and taxonomy of prompt defects, recurring ways that prompts fail to elicit their intended behavior from LLMs. We organize defects along six dimensions: (1) Specification and Intent, (2) Input and Content, (3) Structure and Formatting, (4) Context and Memory, (5) Performance and Efficiency, and (6) Maintainability and Engineering. Each dimension is refined into fine-grained subtypes, illustrated with concrete examples and root cause analysis. Grounded in software engineering principles, we show how these defects surface in real development workflows and examine their downstream effects. For every subtype, we distill mitigation strategies that span emerging prompt engineering patterns, automated guardrails, testing harnesses, and evaluation frameworks. We then summarize these strategies in a master taxonomy that links defect, impact, and remedy. We conclude with open research challenges and a call for rigorous engineering-oriented methodologies to ensure that LLM-driven systems are dependable by design.

We present the task description of the Detection and Classification of Acoustic Scenes and Events (DCASE) 2023 Challenge Task 2: ``First-shot unsupervised anomalous sound detection (ASD) for machine condition monitoring''. The main goal is to enable rapid deployment of ASD systems for new kinds of machines without the need for hyperparameter tuning. In the past ASD tasks, developed methods tuned hyperparameters for each machine type, as the development and evaluation datasets had the same machine types. However, collecting normal and anomalous data as the development dataset can be infeasible in practice. In 2023 Task 2, we focus on solving the first-shot problem, which is the challenge of training a model on a completely novel machine type. Specifically, (i) each machine type has only one section (a subset of machine type) and (ii) machine types in the development and evaluation datasets are completely different. Analysis of 86 submissions from 23 teams revealed that the keys to outperform baselines were: 1) sampling techniques for dealing with class imbalances across different domains and attributes, 2) generation of synthetic samples for robust detection, and 3) use of multiple large pre-trained models to extract meaningful embeddings for the anomaly detector.

Benefiting from generalizability of vision-language models (VLMs) such as CLIP, many zero-/few-shot anomaly detection (AD) approaches have achieved impressive detection performance across various datasets. Nevertheless, they require substantial training on large auxiliary datasets to adapt VLMs to anomaly detection, and their inference largely relies on visual-text embedding similarity-based anomaly scores, lacking reasoning abilities to detect complex anomalies that require in-depth contextual understanding. To address this limitation, we propose AnomalyAgent, a novel training-free, agentic framework that leverages the advanced reasoning and generalization capabilities of multimodal large language models (MLLMs) for anomaly detection. The key ingredients include 1) a comprehensive anomaly-centric toolset that enables adaptive MLLM-driven, agentic anomaly reasoning in zero-shot settings, and 2) a customized memory module that grounds anomaly reasoning with few-shot, in-context reference examples. We extend evaluation beyond the detection of simple anomalies (e.g., surface defects like cracks and dents and clear lesions) in widely used benchmarks to more diverse types of anomalies such as logical/contextual anomalies in logistics and manufacturing settings. Extensive experiment results demonstrate that our AnomalyAgent achieves substantially better performance compared to training-free VLM-based AD and generic agentic methods, highlighting its superior generalization capability in both zero-shot and few-shot anomaly detection settings. The code implementation can be find at this address.

Machine learning models, such as neural networks, decision trees, random forests, and gradient boosting machines, accept a feature vector, and provide a prediction. These models learn in a supervised fashion where we provide feature vectors mapped to the expected output. It is common practice to engineer new features from the provided feature set. Such engineered features will either augment or replace portions of the existing feature vector. These engineered features are essentially calculated fields based on the values of the other features. Engineering such features is primarily a manual, time-consuming task. Additionally, each type of model will respond differently to different kinds of engineered features. This paper reports empirical research to demonstrate what kinds of engineered features are best suited to various machine learning model types. We provide this recommendation by generating several datasets that we designed to benefit from a particular type of engineered feature. The experiment demonstrates to what degree the machine learning model can synthesize the needed feature on its own. If a model can synthesize a planned feature, it is not necessary to provide that feature. The research demonstrated that the studied models do indeed perform differently with various types of engineered features.

In this paper, we introduce an approach for detecting modifications in assembled printed circuit boards based on photographs taken without tight control over perspective and illumination conditions. One instance of this problem is the visual inspection of gas pumps PCBs, which can be modified by fraudsters wishing to deceive costumers or evade taxes. Given the uncontrolled environment and the huge number of possible modifications, we address the problem as a case of anomaly detection, proposing an approach that is directed towards the characteristics of that scenario, while being well-suited for other similar applications. The proposed approach employs a deep convolutional autoencoder trained to reconstruct images of an unmodified board, but which remains unable to do the same for images showing modifications. By comparing the input image with its reconstruction, it is possible to segment anomalies and modifications in a pixel-wise manner. Experiments performed on a dataset built to represent real-world situations (and which we will make publicly available) show that our approach outperforms other state-of-the-art approaches for anomaly segmentation in the considered scenario, while producing comparable results on the popular MVTec-AD dataset for a more general object anomaly detection task.

Training a unified model is considered to be more suitable for practical industrial anomaly detection scenarios due to its generalization ability and storage efficiency. However, this multi-class setting, which exclusively uses normal data, overlooks the few but important accessible annotated anomalies in the real world. To address the challenge of real-world anomaly detection, we propose a new framework named Dual Memory bank enhanced representation learning for Anomaly Detection (DMAD). This framework handles both unsupervised and semi-supervised scenarios in a unified (multi-class) setting. DMAD employs a dual memory bank to calculate feature distance and feature attention between normal and abnormal patterns, thereby encapsulating knowledge about normal and abnormal instances. This knowledge is then used to construct an enhanced representation for anomaly score learning. We evaluated DMAD on the MVTec-AD and VisA datasets. The results show that DMAD surpasses current state-of-the-art methods, highlighting DMAD's capability in handling the complexities of real-world anomaly detection scenarios.

Anomaly detection in images plays a significant role for many applications across all industries, such as disease diagnosis in healthcare or quality assurance in manufacturing. Manual inspection of images, when extended over a monotonously repetitive period of time is very time consuming and can lead to anomalies being overlooked.Artificial neural networks have proven themselves very successful on simple, repetitive tasks, in some cases even outperforming humans. Therefore, in this paper we investigate different methods of deep learning, including supervised and unsupervised learning, for anomaly detection applied to a quality assurance use case. We utilize the MVTec anomaly dataset and develop three different models, a CNN for supervised anomaly detection, KD-CAE for autoencoder anomaly detection, NI-CAE for noise induced anomaly detection and a DCGAN for generating reconstructed images. By experiments, we found that KD-CAE performs better on the anomaly datasets compared to CNN and NI-CAE, with NI-CAE performing the best on the Transistor dataset. We also implemented a DCGAN for the creation of new training data but due to computational limitation and lack of extrapolating the mechanics of AnoGAN, we restricted ourselves just to the generation of GAN based images. We conclude that unsupervised methods are more powerful for anomaly detection in images, especially in a setting where only a small amount of anomalous data is available, or the data is unlabeled.

Accurate state estimation in Unmanned Aerial Vehicles (UAVs) is crucial for ensuring reliable and safe operation, as anomalies occurring during mission execution may induce discrepancies between expected and observed system behaviors, thereby compromising mission success or posing potential safety hazards. It is essential to continuously monitor and detect such conditions in order to ensure a timely response and maintain system reliability. In this work, we focus on UAV state estimation anomalies and provide a large-scale real-world UAV dataset to facilitate research aimed at improving the development of anomaly detection. Unlike existing datasets that primarily rely on injected faults into simulated data, this dataset comprises 1396 real flight logs totaling over 52 hours of flight time, collected across diverse indoor and outdoor environments using a collection of PX4-based UAVs equipped with a variety of sensor configurations. The dataset comprises both normal and anomalous flights without synthetic manipulation, making it uniquely suitable for realistic anomaly detection tasks. A structured classification is proposed that categorizes UAV state estimation anomalies into four classes: mechanical and electrical, external position, global position, and altitude anomalies. These classifications reflect collective, contextual, and outlier anomalies observed in multivariate sensor data streams, including IMU, GPS, barometer, magnetometer, distance sensors, visual odometry, and optical flow, that can be found in the PX4 logging mechanism. It is anticipated that this dataset will play a key role in the development, training, and evaluation of anomaly detection and isolation systems to address the critical gap in UAV reliability research.

Classification algorithms have recently found applications in computational physics for the selection of numerical methods or models adapted to the environment and the state of the physical system. For such classification tasks, labeled training data come from numerical simulations and generally correspond to physical fields discretized on a mesh. Three challenging difficulties arise: the lack of training data, their high dimensionality, and the non-applicability of common data augmentation techniques to physics data. This article introduces two algorithms to address these issues, one for dimensionality reduction via feature selection, and one for data augmentation. These algorithms are combined with a wide variety of classifiers for their evaluation. When combined with a stacking ensemble made of six multilayer perceptrons and a ridge logistic regression, they enable reaching an accuracy of 90% on our classification problem for nonlinear structural mechanics.

In this paper, we explore a novel approach to 3D anomaly detection (AD) that goes beyond merely identifying anomalies based on structural characteristics. Our primary perspective is that most anomalies arise from unpredictable defective forces originating from both internal and external sources. To address these anomalies, we seek out opposing forces that can help correct them. Therefore, we introduce the Mechanics Complementary Model-based Framework for the 3D-AD task (MC4AD), which generates internal and external corrective forces for each point. We first propose a Diverse Anomaly-Generation (DA-Gen) module designed to simulate various types of anomalies. Next, we present the Corrective Force Prediction Network (CFP-Net), which uses complementary representations for point-level analysis to simulate the different contributions from internal and external corrective forces. To ensure the corrective forces are constrained effectively, we have developed a combined loss function that includes a new symmetric loss and an overall loss. Notably, we implement a Hierarchical Quality Control (HQC) strategy based on a three-way decision process and contribute a dataset titled Anomaly-IntraVariance, which incorporates intraclass variance to evaluate our model. As a result, the proposed MC4AD has been proven effective through theory and experimentation. The experimental results demonstrate that our approach yields nine state-of-the-art performances, achieving optimal results with minimal parameters and the fastest inference speed across five existing datasets, in addition to the proposed Anomaly-IntraVariance dataset. The source is available at https://github.com/hzzzzzhappy/MC4AD

Industrial visual anomaly detection is usually one-class: normal images are abundant, while defects are rare, heterogeneous, and often unavailable during system design. PatchCore-style retrieval suits this setting because it scores test images from a memory bank of normal patch features, but the standard Euclidean geometry ignores feature correlations and its offline construction materialises the full patch pool before subsampling. We introduce Mahalanobis PatchCore, a covariance-aware, streaming-compatible extension of PatchCore. Its artificial intelligence contribution is a retrieval detector that estimates a regularised covariance model in reduced feature space and whitens embeddings, so Euclidean nearest-neighbour search after transformation implements Mahalanobis retrieval. A bounded-memory, re-iterable training pipeline builds the memory bank without storing all normal patches at once, using incremental dimensionality reduction, online covariance estimation, and streaming aggregation. The engineering application is automated industrial inspection, where visual anomaly detection must remain accurate under practical memory limits. We evaluate the method on a public 15-category industrial anomaly-detection benchmark and three industrial datasets covering blow-fill-seal strip-ampoule meniscus inspection, amber-glass-ampoule bottom inspection, and lyophilised-cake vial inspection. Mahalanobis PatchCore preserves most offline PatchCore image-level performance on the public benchmark while reducing peak memory from 5.41 to 2.78 GB, and improves the selected industrial mean image area under the receiver operating characteristic curve from 0.981 to 0.986.

Mechanical defects in real situations affect observation values and cause abnormalities in multivariate time series, such as sensor values or network data. To perceive abnormalities in such data, it is crucial to understand the temporal context and interrelation between variables simultaneously. The anomaly detection task for time series, especially for unlabeled data, has been a challenging problem, and we address it by applying a suitable data degradation scheme to self-supervised model training. We define four types of synthetic outliers and propose the degradation scheme in which a portion of input data is replaced with one of the synthetic outliers. Inspired by the self-attention mechanism, we design a Transformer-based architecture to recognize the temporal context and detect unnatural sequences with high efficiency. Our model converts multivariate data points into temporal representations with relative position bias and yields anomaly scores from these representations. Our method, AnomalyBERT, shows a great capability of detecting anomalies contained in complex time series and surpasses previous state-of-the-art methods on five real-world benchmarks. Our code is available at https://github.com/Jhryu30/AnomalyBERT.

Class-incremental learning (CIL) is a particularly challenging variant of continual learning, where the goal is to learn to discriminate between all classes presented in an incremental fashion. Existing approaches often suffer from excessive forgetting and imbalance of the scores assigned to classes that have not been seen together during training. In this study, we introduce a novel approach, Prediction Error-based Classification (PEC), which differs from traditional discriminative and generative classification paradigms. PEC computes a class score by measuring the prediction error of a model trained to replicate the outputs of a frozen random neural network on data from that class. The method can be interpreted as approximating a classification rule based on Gaussian Process posterior variance. PEC offers several practical advantages, including sample efficiency, ease of tuning, and effectiveness even when data are presented one class at a time. Our empirical results show that PEC performs strongly in single-pass-through-data CIL, outperforming other rehearsal-free baselines in all cases and rehearsal-based methods with moderate replay buffer size in most cases across multiple benchmarks.

In recent years, performance on existing anomaly detection benchmarks like MVTec AD and VisA has started to saturate in terms of segmentation AU-PRO, with state-of-the-art models often competing in the range of less than one percentage point. This lack of discriminatory power prevents a meaningful comparison of models and thus hinders progress of the field, especially when considering the inherent stochastic nature of machine learning results. We present MVTec AD 2, a collection of eight anomaly detection scenarios with more than 8000 high-resolution images. It comprises challenging and highly relevant industrial inspection use cases that have not been considered in previous datasets, including transparent and overlapping objects, dark-field and back light illumination, objects with high variance in the normal data, and extremely small defects. We provide comprehensive evaluations of state-of-the-art methods and show that their performance remains below 60% average AU-PRO. Additionally, our dataset provides test scenarios with lighting condition changes to assess the robustness of methods under real-world distribution shifts. We host a publicly accessible evaluation server that holds the pixel-precise ground truth of the test set (https://benchmark.mvtec.com/). All image data is available at https://www.mvtec.com/company/research/datasets/mvtec-ad-2.